Ask questions and find answers on ST MEMS sensors, such as the LSM6DSV and the LSM6DSL. Learn how to use the SensorTile.Box, and STEVAL kits.
Hi! I’m using the LSM6DSLTR, and really just need to trigger an interrupt whenever the device rotates at a speed greater or equal to a given threshold. Do I need to set up any FIFO data, or is there a way to only generate an interrupt based on a ro...
I am trying to build custom boards using LSM9DS1, I shot through the data sheet, but the information on these two pins is not clear enough? What is the purpose of these pins(DRDY_M & DEN_A/G)?
I need to confirm what the ODR represents - the default ODR is 26667Hz. But what is the actual internal sample rate pre anti-aliasing filter (which must be implemented internally)?Assuming the actual Fsample is at least 26667, then ODR simply represe...
Hello fellow ST guys. I'm working with the LSM6DSO IMUs in my project. Nice chip indeed. Now I need to connect multiple IMUs and I need to synchronize them, so that I can read the data from all of those chips sequentially (asserting chip select pins...
Hi I have four questions please: 1- is there a new version of the UM2499 pdf manual, as most of the links are broken ? 2- I get this error with IBM watson IoT quickstart - (kCFErrorDomainCFNetwork error 2), i get this in different Iphones. As i thoug...
I have an embedded platform AT91SAM9260 based running on a buildroot based Linux with kernel 4.19.78-linux4sam-6.2 which includes an LSM6DSO and a LIS2MDLTR as well.When st_* drivers are loaded all communications via i2c is returning EBUSY and even ...
Hello, I'm working with STEVAL-STWINKT1B kit and the latest version of FP-SNS-DATALOG1 sw package.I'm trying to set the ISM330DHCX 's ODR to 208 samples/s but in this case the acquisitions are corrupted.Is there any known bug?The ODR is set by modify...
I am wondering wether this device offers a self-test feature similar to its low-g cousin, the LIS331. I noticed that there is an app note attached on the product page of the H3LIS331DL that specifically describes the self-test feature in ST’s MEMS se...
