2021-12-06 09:55 PM
Dear all:
Thanks.
Solved! Go to Solution.
2021-12-09 03:06 AM
Hi @YSONG.1 ,
For a description of, you can refer to the DT0127 Design tip document, and in particular to p.1 and 2:
The self-test feature embedded in a MEMS sensor allows checking the functionality of its mechanical part without needing to apply any defined external motion. When the self-test feature is enabled, an electrostatic force deflecting the mechanical sensing element is activated inside the sensor, simulating device movement. As a consequence, output data of a fully functional device will change within limits predefined in the device datasheet.
The advantage of using the self-test feature is that you do not need to (actually you must not) physically move the device during the test. Moreover it is very fast as it takes no more than one second of data processing. During the self-test, the user also ensures that the serial communication with the device is working properly
The advantage of using the self-test feature is that you do not need to (actually you must not) physically move the device during the test. Moreover it is very fast as it takes no more than one second of data processing. During the self-test, the user also ensures that the serial communication with the device is working properly.
The positive and the negative sign of the self-test tells us in which direction is the mechanical part of the accelerometer deflected by the applied internal electrostatic force. The direction option is available in the sensor configuration registers and the user can select one or the other direction as preferred. The only difference is that the positive sign self-test applies static force in the positive direction and the negative sign self-test in the opposite direction.
If my reply answered your question, please click on Select as Best at the bottom of this post. This will help other users with the same issue to find the answer faster.
Best regards,
Eleon
2021-12-09 03:06 AM
Hi @YSONG.1 ,
For a description of, you can refer to the DT0127 Design tip document, and in particular to p.1 and 2:
The self-test feature embedded in a MEMS sensor allows checking the functionality of its mechanical part without needing to apply any defined external motion. When the self-test feature is enabled, an electrostatic force deflecting the mechanical sensing element is activated inside the sensor, simulating device movement. As a consequence, output data of a fully functional device will change within limits predefined in the device datasheet.
The advantage of using the self-test feature is that you do not need to (actually you must not) physically move the device during the test. Moreover it is very fast as it takes no more than one second of data processing. During the self-test, the user also ensures that the serial communication with the device is working properly
The advantage of using the self-test feature is that you do not need to (actually you must not) physically move the device during the test. Moreover it is very fast as it takes no more than one second of data processing. During the self-test, the user also ensures that the serial communication with the device is working properly.
The positive and the negative sign of the self-test tells us in which direction is the mechanical part of the accelerometer deflected by the applied internal electrostatic force. The direction option is available in the sensor configuration registers and the user can select one or the other direction as preferred. The only difference is that the positive sign self-test applies static force in the positive direction and the negative sign self-test in the opposite direction.
If my reply answered your question, please click on Select as Best at the bottom of this post. This will help other users with the same issue to find the answer faster.
Best regards,
Eleon
2021-12-10 01:41 AM
@Eleon BORLINI
Thanks for your help,so i think if the selftest diff data exceed 70mg or 1500mg ,maybe it's hardware problem.