How to test handling of H7 ECC in SRAM
Hi all,
When writing tests for handling single and double errors on the STM32H753/43/42/50, there doesn’t appear to be a way to turn off the ECC or access the parity bits to force single or double errors. Relying on them occurring randomly isn't great and I'd really like to be able to inject known errors at known locations. Flash memory can be tested by judicious overwriting of codewords to manipulate the parity symbols but that technique won’t work on SRAM.
Section 2.5 of AN5342 mentions there may be routines available (which would be great to have) but I can’t find other reference to how this might be done - even if via DAP.

