Temperature Drift of the Internal Clock (HSI) of "STM32F446ZCJ"

[Massa_4]

Hellow

• In DS10639 P105 [6.3.10 internal clock source characteristics], regarding the measurement conditions of TA (ambient temperature) described in Table 41:

  1. Is the measurement method of TA (ambient temperature) based on the temperature of a thermostatic chamber, or is it the temperature measured at a fixed measurement position? If it is the temperature measured at a fixed measurement position, please provide the distance from the CPU to the measurement position.
  2. What is the operating time at the ambient temperature being checked? (e.g., measuring drift after operating at 80°C for 2 hours)

• Could you provide data equivalent to Figure 1 in AN5076 P6 [2.2 Drift of internal oscillator before and after reflow] for the CPU "STM32F446ZCJ" being used?

• In AN5076 P8 [3.1 Thermal effects], the fifth line states "(The frequency may increase, but this is rare)", but in Figure 1 of AN5076 P6 [2.2 Drift of internal oscillator before and after reflow], it appears that the frequency generally drifts in the direction of increasing. Please confirm if the description in [3.1] is correct, as there seems to be a discrepancy.

• When the CPU is mounted on a board and stored for a long period, does the internal CLOCK drift? If drift occurs, to what extent (percentage) does it drift?

[mƎALLEm]

Hello,

For these specific questions, I suggest you to open an online support ticket over this link.