When using the RAM self-test feature in X-CUBE-STL, I enabled the RAM backup buffer in the application by not defining STL_DISABLE_RAM_BCKUP_BUF. I also allocated a section in the scatter file:
; 128KB DTCM
RW_STL_TM_RAM 0x20000000 0x20 { ; Place STL RAM TM backup buffer outside tested subsets (i.e., beginning of RAM)
*(backup_buffer_section)
}
This section is explicitly excluded from the self-test region. My question is: How is the integrity of the RAM backup buffer itself ensured? If it is not tested, could errors in this buffer compromise the self-test process or data recovery? Do I need additional measures to guarantee its reliability?
