I have several "mystery" failures of STN1HN60 in one of our commercial product ranges.
There is no easy design fault or abnormal condition that that we can find.
I would like to analyze ththe failures by observing the internals of the faulty part.
Some other manufacturers have application notes with images of the different failures but they do not seem to apply to the Supermesh type parts.
Can ST please provide this for the Supermesh type FET?
If not, can SST help in any other way please?
