How to reproduce the STM32WL33 datasheet RX sensitivity figures (-132dBm/-128dBm/-112dBm) using NUCLEO-WL33 + RadioExplorer GUI?
Hello,
We have designed a custom RF module based on the STM32WL33, and one of our
customers is asking us to demonstrate that the RX sensitivity of our module
matches the values published in the datasheet:
- RX sensitivity @ 1% BER:
-132 dBm @ 300 bit/s, 433 MHz, OOK
-128 dBm @ 300 bit/s, 868 MHz, 2(G)FSK
-112 dBm @ 38.4 kbit/s, 868 MHz, 2(G)FSK
To validate this, we would like to reproduce the exact test conditions using
an official ST development board (e.g. NUCLEO-WL33) and the
STM32WL33 GUI, so the result is directly comparable to the
datasheet.
In the GUI's "Radio settings" tab we can set: fc, DR (ksps), Fdev (kHz),
CHF (channel filter bandwidth, kHz), modulation (OOK/2(G)FSK/4(G)FSK/ASK),
Spread Factor, and Pout.
Could you please help us with the following:
1. What DR / Fdev / CHF / Spread Factor values did ST use internally to
characterize each of the three sensitivity points above? In particular:
- For -132 dBm @ 300 bit/s / 433 MHz / OOK: Under the test conditions of 132 dBm @ 300 bit/s 433 MHz OK, what deviation, DR, Fdev, and CHF should I use to see -132 dBm?
- For -128 dBm @ 300 bit/s / 868 MHz / 2(G)FSK: what Fdev (modulation
index) and CHF were used at this very low data rate?
Is FEC enabled?
Our goal is to give our customer a reproducible test procedure (hardware +
GUI settings + measurement method) that lets them independently confirm the
datasheet numbers on our custom module. Any pointers to the right
configuration values or documentation would be greatly appreciated.
Thank you!
