FIT rate / reliability data request for STM32U545RET6Q
Dear STMicroelectronics Support Team,
we are preparing a reliability prediction report for an electronic assembly intended for customer qualification.
The calculation is based on a parts count approach using IEC TR 63162:2025 as source of reference failure rates and IEC 61709:2017 for conversion to operating conditions.
For the component STM32U545RET6Q, currently classified as a CMOS microcontroller according to IEC TR 63162, we kindly ask whether ST can provide manufacturer-specific reliability data, in particular:
- FIT rate or failure rate for STM32U545RET6Q, or for the STM32U5 family;
- reference conditions of the FIT value, including temperature, voltage, operating profile and confidence level;
- method or standard used for the reliability evaluation, for example IEC 61709, JEDEC, internal field data, HTOL, qualification data or other;
- reliability / qualification report that can support the use of the data in a customer-facing reliability prediction report;
- any applicable limitation regarding the use or quotation of the provided FIT value.
The assembly operates in indoor switchgear/controlgear conditions, with ambient temperature range -15 °C to +40 °C, 24 h average ambient temperature not exceeding +35 °C, no solar radiation, altitude below 1000 m, very light pollution severity, and 24 h average relative humidity up to 95%.
We are currently using a generic handbook value from IEC TR 63162 and would like to replace it, if possible, with manufacturer-specific data.
Best regards,
